Keysight MXR104B – Infiniium MXR-B Series Oscilloscope (4 Analog Channels / 1 GHz)

Description

The Keysight MXR104B digital storage oscilloscope uncovers critical sub-nanosecond propagation delays inside wideband serial bus networks and high-frequency communication pathways. This quad-channel mixed-signal validation instrument utilizes a massive 15.6-inch display workspace driven by advanced hardware processing arrays to map, measure, and isolate rapid transient voltage anomalies and clock glitches across modern multi-layer circuit configurations simultaneously.

Operating at a continuous 16 GS/S maximum real-time sampling rate across active input channels with a blistering 430 ps sub-nanosecond rise time threshold and a 200 Mpts deep acquisition memory layout, the platform captures random voltage transients accurately. This high-performance hardware framework incorporates an advanced digitizer engine to minimize quantization errors and accelerate cross-domain debugging throughput.

Key Features of Keysight MXR104B

• 1 GHz Base System Bandwidth: Verifies sharp timing edges on high-frequency clock routes and wideband serial buses.
• 430 ps Picosecond Rise Time: Resolves ultra-sharp fast-edge digital transitions to accurately evaluate critical timing violations.
• Four Analog Input Channels: Coordinates concurrent timing analysis across multiple independent signal paths and rails.
• High-Speed 16 GS/S Real-Time Sampling: Captures complex transient electronic phenomena and high-frequency voltage spikes accurately.
• 200 Mpts Deep Waveform Memory: Sustains peak horizontal sampling resolution over long, uninterrupted trace capture windows.
• 200,000 wfms/s Refresh Engine: Exposes rare circuit faults instantly by minimizing internal trigger dead time.
• Expansive 15.6-Inch Display Interface: Simplifies complex trace measurements, cursoring, and multi-domain analysis on live loops.

Wideband Digital Sub Nanosecond Acquisition Precision

The core processing layer leverages a premium vertical resolution digitizer combined with an ultra-fast 430 ps rise time and an exceptional 16 GS/S real-time sampling rate to eliminate configuration latency during unpredictable circuit evaluations. This quad-channel configuration enables automated test engineers, repair technicians, and research labs to view low-amplitude deviations across four analog channels simultaneously without risking signal attenuation near the Nyquist frequency limit. All real-time waveforms are processed instantly through the internal digitizer framework to maintain an optimal signal-to-noise ratio and isolate underlying clock jitter from external facility electromagnetic interference paths across standard LAN/Ethernet and USB endpoints.

Automated Test Equipment Network Protection

Constructed to excel in automated testing environments (ATE), high-reliability laboratory development benches, and advanced engineering facilities, the rigid 15.6-inch screen setup protects sensitive internal hardware while operating under flexible 120V 50/60 Hz supply lines. The underlying multi-instrument engineering layout native to the platform ensures streamlined automated data extraction onto the local internal hard drive without structural baseline thermal drift during long-term operational testing loops. Guaranteeing clear equipment transparency and asset lifecycle alignment, this test instrument comes standard with a verified 1-Year Warranty framework to support facility engineering standards.